Developed in partnership with dFakto and previewed at edUcon, the AI-powered platform goes beyond dates, rates and space. It features a destination marketing organisation (DMO) validation process. Participating destinations and venues review and, most importantly, verify their respective profiles, ensuring accurate and current content. The curated data incorporates information such as sustainability initiatives, safety measures, economic sectors, citywide events, infrastructure developments and more.
DestinAItor leverages strategic data partnerships with Tempest and Simpleview to integrate meetings and events data, allowing events strategists to easily compare multiple destinations based on objective, verified data. DestinAItor also includes an RFP feature that can analyse a planner’s request for proposal and suggest matching destinations.
Insights from the DestinAItor platform are complimentary for business events strategists. Destinations and venues interested in being searchable with destination data and moving forward with achieving the “Verified Destination” badge can learn more here.
PCMA and CEMA President & CEO, Sheriff Karamat, CAE, emphasised the significance of Destinaitor, stating, “DestinAItor will revolutionise how business events strategists research destinations and venues. The platform is dynamic. This is going to be a continued evolution of empowering our global business events community with tools that are intuitive and responsive to their needs.”
Participating destinations and venues benefit from performance reports and analytics on search patterns and trending destinations as the platform allows destinations and venues to highlight unique value propositions, ultimately attracting business that aligns with their respective strategic goals.
Thibaut De Vylder, dFakto CEO, added that this platform is an opportunity for destinations and venues to control their data and brand narrative, address poor lead generation, and overcome RFP spam, while gaining performance insights through analytics on search patterns.
